多功能掃描探針顯微鏡（帶納米力學(xué)測試功能）型號：NT-206，是集多功能于一身的原子力顯微鏡，帶有復(fù)雜的硬件與軟件分析系統(tǒng)，可分析形貌與力學(xué)性能，分辨率為納米級別?？商砑樱?strong>納米壓痕、劃痕、磨損，附著力、摩擦力測試，納米光刻等功能。
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| A probe is positioned above journal neck of watch gear |
Embedded videosystem in combination with motorized XY micropositioning stage provide convenient tuning of the instrument and its fine targeting onto the features on the sample surface. All that dramatically enhances the instrument's functionality when researching micro- and nanosize objects.
To meet requirements of specific research tasks, AFM NT-206 can include specialized changeable probe holders for microtribometry and adhesiometry or for nanoindentation.
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
多功能掃描探針顯微鏡（帶納米力學(xué)測試功能）技術(shù)指標(biāo)：
Measurement modes: 測量模式： Motion patterns at the measurements:
- area (matrix);
- line;
- single point. | Contact static AFM 接觸靜態(tài) Lateral force microscopy /with contact static AFM/ 橫向力顯微鏡/用靜態(tài)接觸AFM Non-contact dynamic AFM 非接觸式動態(tài)AFM Intermittent contact AFM (similar to Tapping Mode®) 間隙接觸（敲擊） Phase contrast imaging /with intermittent contact AFM/ 相襯成像/用間隙接觸AFM Two-pass mode (for static and dynamic AFM) 6. 兩回合模式（適合靜態(tài)與動態(tài)AFM） Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/兩回合模式，伴隨變化的間距， Multicycle scanning (for static and dynamic AFM) /Original technique!/多回合掃描（適合靜態(tài)與動態(tài)AFM） Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/多回合掃描，伴隨變化的載荷（適合靜態(tài)與動態(tài)AFM） Electrostatic force microscopy (two-pass technique) *, **靜電力顯微鏡（雙回合技術(shù)） Current mode *, **電流模式 Magnetic force microscopy (two-pass technique) *, **磁力顯微鏡（雙回合技術(shù)） Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)靜態(tài)力譜（在測量點，計算定量參數(shù)、表面能與彈性模量） Dynamic force spectroscopy動態(tài)力譜 Dynamic frequency force spectroscopy /Original technique!/動態(tài)頻率力譜 Nanoindentation *納米壓痕 Nanoscratching *納米劃痕 Linear nanowear *線性納米磨損 Nanolithography (with control of load, depth and bias voltage) *納米光刻（控制力，深度，偏壓） Microtribometry * /Original technique!/微觀摩擦力計量 Microadhesiometry * /Original technique!/微觀附著力計量 Shear-force microtribometry * /Original technique!/剪切力微觀摩擦力計量 Temperature-dependent measurements (under all above modes) *基于溫度的測量（適用于所以以上模塊）
Note.
* - Specialized accessories or rig required*需要特殊的附件或工具
** - Specialized probes required **需要特殊的探針 |
Scan field area:掃描面積 | from 5x5 micron up to 50x40 microns |
Maximum range of measured heights:高度范圍 | from 2 to 4 micron |
Lateral resolution (plane XY):側(cè)面分辨率 | 1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z):豎直分辨率 | 0.1–0.5 nm (depending on sample hardness) |
Scanning matrix:掃描矩陣 | Up to 1024x1024 points |
Scan rate:掃描速度 | 40–250 points per second in X-Y plane |
Nonlinearity correction :非線性校正 | A software nonlinearity correction provided |
Minimum scanning step:最小掃描步階 | 0.3 nm |
Scanning scheme:掃描步驟 | The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type:掃描器類型 | A piezoceramic tube. |
Cantilevers (probes):懸臂（探針） | Commercial AFM cantilevers of 3.4x1.6x0.4 mm.
Recommended are probes from Mikromasch or NT-MDT. Checked for operation with probes by BudgetSensor and Nanosensors |
Cantilever deflection detection system:懸臂傾斜探測系統(tǒng) | Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size:樣品尺寸 | Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm |
High voltage amplifier output: 高壓放大器輸出 | +190 V |
ADC: | 16 bit |
Operation environment:操作環(huán)境 | Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head:測量頭自動移動范圍 | 10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring |
Overall dimensions:總尺寸 | Scanning unit: 185x185x290 mm
Control electronic unit: 195x470x210 mm |
Field of view of embedded videosystem:植入視頻系統(tǒng)的視場 | 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation:防震隔離 | Additional antivibration table is recommended |
Host computer:控制計算機 | Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port.
Recommended: Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows® XP SP2 or higher, 2 free USB port. |
Software:軟件 | Special control software SurfaceScan ａnd the AFM image processing package SurfaceView / SurfaceXplorer are included. |
* Before measurements, the probe can be positioned to necessary place over the sample with help of automated motorized stage. To provide monitoring for the scan area and objects below the probe, the instrument embeds a videosystem allowing to watch the probe motion over the sample surface. Videosystem and the motorized stage for the probe positioning over sample are included in base set by default. A combination of these two options allows rather flexible selection of objects to be measured on the sample surface at direct visual monitoring by the opeartor.
多功能掃描探針顯微鏡（帶納米力學(xué)測試功能）組成模塊：
DELIVERY SET
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
多功能掃描探針顯微鏡（帶納米力學(xué)測試功能）軟件
SOFTWARE
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
Control software for AFM NT-206 SurfaceScan is a 32-bit Windows application.
It runs under Windows XPsp2/Vista/7 operating systems.
The control software provides all preliminary tunings and settings necessary for the AFM operation: visual control over the laser-beam detection system adjustment, tuning of the cantilever oscillations (in dynamic modes), feed-back system adjusting, sample positioning under the probe and sample approach to the probe before measurements and removal after the measurements. A full-field or any reduced area within the full field of the scanner can be selected for measurements.
Operator can watch any combination of acquired AFM/LFM images in data visualization window or switch to look at them in one window. Additionally, profile of currenly acquired line can be monitored as well.
Acquired data are saved in files of special format that can be then processed, visualised (in 2-D and 3-D presentation) and analysed with a specialized software package SurfaceView or SurfaceXplorer.
