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白光共聚焦輪廓儀MICROMESURE2產(chǎn)品主要特點:NoncontactdimensionalmeasurementNanometricandMicrometricresolutionsWhitelightsensor(nospeckle
產(chǎn)品主要特點:
Non contact dimensional measurement
Nanometric and Micrometric resolutions
White light sensor (no speckle, wide measuring range)
Coaxial measurement (no shadowing)
High local slopes on specular (reflective) surfaces
Insensitive to ambient light
Insensitive to object’s reflectivity: allows working on any type of surface
Thickness & Form Measurement of transparent objects
Wide measuring ranges capabilities (from 20 μm to 24 mm)
MICROMESURE is a modular measurement system dedicated to high resolution 3D microtopography and to shape and texture analysis. It can be used to measure profiles or surfaces of samples, as well as for measuring the thickness of transparent materials.
Due to high quality scanning system
Due to high quality scanning system
- Real metrology on each measured points thanks to linear encoders
- Flatness and orthogonality corrections
- Equipped with double turret
- User friendly Software
- Modular design (1, 2 or 3 axes) to adapt the configuration to the exact needs of the user
Delivered with all the necessary control & acquisition hardware and software, the MICROMESURE 2 system is a ?turn key? device that is immediately operational after its installation.
- Point scanning system allows to define scans dimensions and resolution without hardware constraints
MICROMESURE 2 Systems
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